- Scanning electron microscope (SEM) Zeiss EVO15 with energy dispersive (EDX) analyzer
- Stereomicroscope with Olympus SZX accessories
- Digital microscope Olympus DSX 510
- Atomic force microscope (AFM) AIST-NT SmartSPM 1000 with Kelvin probe (SKPFM)
- Wicinski-Wicinski scanning Kelvin probe (SKP) for electrochemical measurements under atmospheric conditions
- Analyzer of elemental hydrogen, nitrogen and oxygen in materials by fusion method in inert gas, Bruker G8 Galileo
- Spark optical emission spectrometer Bruker Q4 Tasman for precise analyses of elemental composition of metallic materials
- Tearing machine UTS-E50 for determination of mechanical properties of materials in tension, compression and bending and tear-off tests with a maximum load of 50 kN
- Biologic SP-200 potentiostats for electrochemical measurements including electrochemical impedance spectroscopy method
- Thermal analyzer Setaram Evo TGA/DTA
- Shimadzu UV-2600 UV-Vis Spectrophotometer
- Nicolet iS50 Infrared and Raman Spectrometer
- DXR2 Smart Dispersive Raman Spectrometer
- Agilent 5100 ICP-OES Optical Emission Spectrometer
- Xenometrix Genius IF XRF Spectrometer
- Z-300 LIBS Spectrometer
- Melt Flow Index (Extrusion Plastometer)
- Thermal Conductivity Analyzer
Our instruments
: 22.5.2025 22:44, : Jan Prošek